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Eureka 對(duì)記憶模組進(jìn)行快速的功能動(dòng)態(tài)測(cè)試，并采用多個(gè)先進(jìn)的檢查模式來檢測(cè)出短/斷路**、單一顆粒**、記憶胞間的絕緣**、時(shí)序及雜訊問題引起的間歇性**…等記憶體測(cè)試設(shè)備 Eureka
加裝選購的漏電流測(cè)試轉(zhuǎn)接模組后，即可進(jìn)行半導(dǎo)體漏電流特性的測(cè)試，并能檢出DRAM晶片的微小漏電流。
Eureka 具有內(nèi)建的SPD(serial presence detect)燒錄器可用來燒錄及驗(yàn)證測(cè)試SPD內(nèi)容，可在記憶體模組測(cè)試時(shí)隨同進(jìn)行。
Eureka加入了許多加強(qiáng)功能來提升測(cè)試的正確性，像晶片預(yù)熱chip-heating，電源電壓變動(dòng)模擬voltage bouncing，循環(huán)(回路)測(cè)試loop test，
可調(diào)式時(shí)基adjustable timing parameters (selected)，可調(diào)整式更新模式及周期alterable refresh mode and cycle，更新測(cè)試refresh test，
ICC電流測(cè)定，也有Address與RAS/CAS測(cè)試，不論有/無緩沖級(jí)的模組，Eureka都能支援同位與ECC 位元檢查，
另外，Eureka也能配合CST*新的RoboFlex自動(dòng)取置機(jī) 來進(jìn)行全自動(dòng)測(cè)試，其效能表現(xiàn)更是如虎添翼，此外，可額外選購加裝的測(cè)試配備有Flash testing，
Cache testing，DRAM & SDRAM TSOP Chips testing

規(guī)格

DDR testing platform
Clock Frequency	200 Mhz & 266 Mhz selectable
Address Depth	4 Gigawords test capacity up to 16 row x 16 column
Data Width	Expandable up to 80 bits
Timing Range	-1 , 0 and 1 ns
Timing Resolution	1 ns
Vdd Range	0.1V to 2.7V with 0.1V step and 10%Bounce
Vih, Voref Range	0.1V to 2.7V with 0.1V step
Read Latency	2,3 clocks
Refresh Cycle	Auto/Self Refresh - 8祍/Row
Refresh Modes	Auto Refresh , Self Refresh
Leakage Test Option	+/- 1礎(chǔ) to +/- 5mA
Test Features	Burst Mode, Programmable Data Mask, Data Strobe, and Clock Suspend Modes
Current Test	Icc Standby, Icc Operating-Avg Icc up to 1.5A, Peak Curent up to 2.0A
Burst Length	Programmable to 2,4,8
CAS Latency	Programmable read Latency From Column Address
Serial PD	256 Bytes programmable
Testing Support Options	DDR 184pin DIMM and 200pin SODIMM
SDRAM testing platform
Clock Frequency	133 mhz 100 mhz, 66mhz, 33mhz selectable
Address Depth	4 Gigawords test capacity up to 16 row x 16 column
Data Width	Expandable up to 160 bits
Timing Range	0ns to 20ns in 1ns resolution
Timing Resolution	in steps of 1ns resolution
Vcc Range	0.1V to 3.6V with 0.1V step and 10 %Bounce
Vih, Voref Range	0.1V to 3.6V with 0.1V step
Read Latency	1,2,3 clocks
Refresh Cycle	Auto/Self Refresh - 8祍/Row to 64祍/Row
Refresh Modes	RAS only, CAS before RAS, Self Refresh
Leakage Test Option	+/- 1礎(chǔ) to +/- 5mA
Test Features	Burst Mode, Programmable Data Mask and Clock Suspend Modes
Current Test	Icc Standby, Icc Operating-Avg Icc up to 1.5A, Peak Curent up to 2.0A
Burst Length	Programmable to 1,2,4,8 or Full Page
CAS Latency	Programmable read Latency From Column Address
Serial PD	256 Bytes programmable
Testing Support Options	SDRAM 100p, 168p, 200p, 244p, 278p DIMM, 144p Sodimm, TSOP, SGRAM 144p and many more
General specifications
Power Requirements	90-130 VAC, 180-260 VAC at 50Hz or 60 Hz
Operating Temperature	-20 to 100 degree Fahrenheit
Humidity	20% to 80%, non condensing
Overcurrent Protection	2A; to prevent Vcc and Ground short problems
Host Computer Requirement (Not Included)	IBM PC or Compatible 386/486/Pentium with one ISA or EISA bus interface slot available for CST, Inc. proprietary interface card
Operating System Requirement (Not Included)	Standard Microsoft Window Windows 95/9